The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since then structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial to our understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in all branches of science that deal with materials at the atomic level.

Table of Contents

Introduction to the Rietveld Method; 1. The early days: a retrospective view; 2. Mathematical aspects of Rietveld refinement; 3. The flow of radiation in a polycrystalline material; 4. Data collection strategies: fitting the experiment to the need; 5. Background modelling in Rietveld analysis; 6. Analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis; 7. Crystal imperfection broadening and peak shape in the Rietveld method; 8. Bragg reflection profile shape in X-ray powder diffraction patterns; 9. Restraints and constraints in Rietveld refinement; 10. Rietveld refinement with time-of-flight powder diffraction data from pulsed neutron sources; 11. Combined X-ray and neutron Rietveld refinement; 12. Rietveld analysis programs Rietan and Premos and special applications; 13. Position - constrained and unconstrained powder-pattern-decomposition methods; 14. Ab initio structure solutions with powder diffraction data

Reviews

"Each of the chapters has its own comprehensive list of references..." --Materials Characterization