Review, Tutorials, and Perspective.- Trends in the Statistical Assessment of Reliability.- Degradation Processes: An Overview.- Defect Initiation, Growth, and Failure - A General Statistical Model and Data Analyses.- Properties of Lifetime Estimators Based on Warranty Data Consisting only of Failures.- Shock Models.- Shock Models.- Parametric Shock Models.- Poisson Approximation of Processes with Locally Independent Increments and Semi-Markov Switching - Toward Application in Reliability.- On Some Shock Models of Degradation.- Degradation Models.- The Wiener Process as a Degradation Model: Modeling and Parameter Estimation.- On the General Degradation Path Model: Review and Simulation.- A Closer Look at Degradation Models: Classical and Bayesian Approaches.- Optimal Prophylaxis Policy Under Non-monotone Degradation.- Deterioration Processes With Increasing Thresholds.- Failure Time Models Based on Degradation Processes.- Degradation and Fuzzy Information.- A New Perspective on Damage Accumulation, Marker Processes, and Weibull's Distribution.- Reliability Estimation and ALT.- Reliability Estimation of Mechanical Components Using Accelerated Life Testing Models.- Reliability Estimation from Failure-Degradation Data with Covariates.- Asymptotic Properties of Redundant Systems Reliability Estimators.- An Approach to System Reliability Demonstration Based on Accelerated Test Results on Components.- Survival Function Estimation.- Robust Versus Nonparametric Approaches and Survival Data Analysis.- Modelling Recurrent Events for Repairable Systems Under Worse Than Old Assumption.- Survival Models for Step-Stress Experiments With Lagged Effects.- Estimation of Density on Censored Data.- Competing Risk and Chaotic Systems.- Toward a Test for Departure of a Trajectory from a Neighborhood of a Chaotic System.- Probability Plotting with Independent Competing Risks.
From the reviews: "The topics covered are of current interest and include accelerated life testing and degradation models. ... The volume covers a host of applications to the field, including reliability, quality control, economics and finance. The volume is well organized, structured and presented, and the chapters appear in a logical order. It contains a lot of useful information and applications. ... the volume would be a useful resource for researchers and graduate students involved in this arena." (Technometrics, Vol. 52 (4), November, 2010)