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Microstructural Characterization of Materials
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Table of Contents

Preface to the Second Edition. Preface to the First Edition. 1. The Concept of Microstructure. 1.1. Microstructural Features. 1.2. Crystallography and Crystal Structure. 2. Diffraction Analysis of Crystal Structure. 2.1. Scattering of Radiation by Crystals. 2.2. Reciprocal Space. 2.3. X-ray Diffraction Methods. 2.4. Diffraction Analysis. 2.5. Electron Diffraction. 3. Optical Microscopy. 3.1. Geometrical Optics. 3.2. Construction of the Microscope. 3.3. Specimen Preparation. 3.4. Image contrast. 3.5. Working with Digital Images. 3.6. Resolution, contrast and Image Interpretation. 4. Transmission Electron Microscopy. 4.1. Basic Principles. 4.2. Specimen Preparation. 4.3. The Origin of Contrast. 4.4. Kinematic Interpretation of Diffraction Contrast. 4.5. Dynamic Diffraction and Absorption effects. 4.6. Lattice Imaging at High Resolution. 4.7. Scanning Transmission Electron Microscopy. 5. Scanning Electron Microscopy. 5.1. Components of The Scanning electron Microscope. 5.2. Electron Beam-Specimen Interactions. 5.3. Electron Excitation of X-Rays. 5.4. Backscattered Electrons. 5.5. Secondary Electron Emission. 5.6. Alternative Imaging Modes. 5.7. Specimen Preparation and Topology. 5.8. Focused Ion Beam Microscopy. 6. Microanalysis in Electron Microscopy. 6.1. X-Ray Microanalysis. 6.2. Electron Energy Loss Spectroscopy. 7. Scanning Probe Microscopy and Related Techniques. 7.1. Surface Forces and Surface Morphology. 7.2. Scanning Probe Microscopes. 7.3. Field-Ion Microscopy and Atom Probe tomography. 8. Chemical Analysis of Surface Composition. 8.1. X-ray Photoelectron Spectroscopy. 8.2. Auger Electron Spectroscopy. 8.3. Secondary-Ion Mass Spectrometry. 9. Quantitative and Tomographic Analysis of Microstructure. 9.1. Basic Stereological Concepts. 9.2. Accessible and Inaccessible Parameters. 9.3. Optimizing Accuracy. 9.4. Automated Image Analysis. 9.5. Tomography and Three-Dimensional Reconstruction. Appendices. Index.

About the Author

David Brandon, Israel Institute of Technology, Haifa, Israel, is the author of Microstructural Characterization of Materials, 2nd Edition, published by Wiley.Wayne D. Kaplan, Israel Institute of Technology, Haifa, Israel, is the author of Microstructural Characterization of Materials, 2nd Edition, published by Wiley.

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