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Neutron Scattering Data Analysis 1990, Proceedings of the Conference on Neutron Scattering, 14-16 March 1990, Rutherford Appleton Laboratory, UK


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Part 1 General: fundamentals of MAXENT in data analysis, J.Skilling and S.Sibisi; simulated annealing - an introductory review, J.Pannetier; the Bayesian approach to optimal instrument design, D.S.Sivia; GENIE V3 - a tool for neutron scattering data analysis and visualization, C. Moreton-Smith; NUVU - a programme for visualizing neutron scattering data based on UNIRAS, K.M.Crennell. Part 2 Crystalline diffraction: unscrambling powder diffraction data, W.I.F.David; maximum entropy reconstruction of spin density maps in crystals from polarized neutron diffraction study of MoO3.2H2O topotactic dehydration, M.Anne et al; MXD - a least-squares programme for non-standard crystallographic refinements, P.Wolfers; the normalization of spallation source powder diffraction data, R.O.Piltz; the data analysis of reciprocal space volumes, C.C. Wilson. Part 3 Liquids and amorphous diffraction: reverse Monte Carlo (RMC) simulation - modelling dissordered structures from diffraction data, R.L.McGreevy et al; a normalization procedure for liquid diffraction data based on the knowledge of the neutron cross section, F.Cilloco and R.Felici; ATLAS - a package of routines for the analysis of time-of-flight diffraction data from liquid and amorphous samples, A.C.Hannon et al. Part 4 Neutron reflectometry: analysis of neutron reflectivity data using constrained model fitting, J.Penfold; maximum entropy analysis of neutron reflectivity data - some preliminary results, D.S.Sivia et al. Part 5 Small angle scattering: can we justify conventional SANS data analysis, R.E.Ghosh and A.R.Rennie. Part 6 Quasielastic and inelastic scattering: CLIMAX - a programme for force constant refinement from inelastic neutron spectra, G.J.Kearley and J.Tomkinson; the set-up and optimization of scans with the rotating analyzer crystal spectrometer ROTAX, H.Tietze et al; analysis of quasielastic and inelastic scattering data from crystal analyzer instruments, A.Smith et al.

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