Table of Contents

I Introductory.- 1 Introduction.- 2 Semiconductor memory architecture.- 3 Space of memory faults.- 4 Preparation for circuit simulation.- II Testing single-port and two-port SRAMs.- 5 Experimental analysis of two-port SRAMs.- 6 Tests for single-port and two-port SRAMs.- 7 Testing restricted two-port SRAMs.- III Testing p-port SRAMs.- 8 Experimental analysis of p-port SRAMs.- 9 Tests for p-port SRAMs.- 10 Testing restricted p-port SRAMs.- 11 Trends in embedded memory testing.- A Simulation results for two-port SRAMs.- A.1 Simulation results for opens.- A.2 Simulation results for shorts.- A.3 Simulation results for bridges.- B Simulation results for three-port SRAMs.- B.1 Simulation results for opens and shorts.- B.2 Simulation results for bridges.

Reviews

From the reviews: "Static random access memories (SRAMs) enjoy a strategic position in the microelectronic industry. … This book concentrates on the study of fault modeling, testing and test strategies for SRAMs. … The book provides a well-written coverage in the area of single-, two- and n-port SRAM testing, fault modeling, and simulation. It is well-organized and very timely. … The book promises to make valuable contribution to the education of graduate students … . I highly recommend this book … ." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)