Table of Contents

Preface.

1.  Electromagnetic Properties of Materials.

2.  Microwave Theory and Techniques for Materials Characterization.

3.  Reflection Methods.

4.  Transmission/Reflection Methods.

5.  Resonator Methods.

6.  Resonant-perturbation Methods.

7.  Planar-circuit Methods.

8. Measurements of Permittivity and Permeability Tensors.

9.  Measurement of Ferroelectric Materials.

10.  Microwave Measurement of Chiral Materials.

11.  Measurement of Microwave Electrical Transport Properties.

12.  Measurement of Dieletric Properties of Materials at High Temperatures.

Index.

About the Author

L. F. Chen is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.

C. K. Ong is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.

C. P. Neo is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.

V. V. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.

Vijay K. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.