Warehouse Stock Clearance Sale

Grab a bargain today!


Microelectronic Test Structures for CMOS Technology
By

Rating

Product Description
Product Details

Table of Contents

Introduction.- Test Structure Basics.- Resistors.- Capacitors.- MOSFETs.- Ring Oscillators.- High Speed Characterization.- Test Structures of SOI Technology.- Test Equipment and Measurements.- Data Analysis.

Ask a Question About this Product More...
 
This title is unavailable for purchase as none of our regular suppliers have stock available. If you are the publisher, author or distributor for this item, please visit this link.

Back to top