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Fault-Tolerant Systems
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Now combining hardware and software fault tolerance in a single book

Table of Contents

Chapter 1: Preliminaries

Chapter 2: Hardware Fault Tolerance

Chapter 3: Information Redundancy

Chapter 4: Fault-Tolerant Networks

Chapter 5: Software Fault Tolerance

Chapter 6: Checkpointing

Chapter 7: Case Studies

Chapter 8: Defect Tolerance in VLSI Circuits

Chapter 9: Fault Detection in Cryptographic Systems

Chapter 10: Simulation Techniques

Index

About the Author

Israel Koren is Professor Emeritus of Electrical and Computer Engineering at the University of Massachusetts, Amherst. Previously,
he held positions with the Technion---Israel Institute of Technology, Haifa, the University of California at Berkeley, the University
of Southern California, Los Angeles and the University of California, Santa Barbara. He has been a consultant to several companies,
including Analog Devices, AMD, Digital Equipment Corp., IBM, Intel, and National Semiconductors. His research interests include
fault-tolerant computing, cyber-physical systems, computer architecture, computer arithmetic, and secure cryptographic systems.
He has over 300 publications in refereed journals and conferences and served as general chair, program committee chair and program
committee member for numerous conferences C. Mani Krishna is Professor of Electrical and Computer Engineering at the University of Massachusetts, Amherst. He received his PhD in Electrical Engineering
from the University of Michigan in 1984. He previously received a BTech in Electrical Engineering from the Indian Institute of Technology, Delhi, in 1979, and an
MS from the Rensselaer Polytechnic Institute in Troy, NY, in 1980. Dr. Krishna's research interests are in the areas of cyber-physical systems, real-time and fault-tolerant computing, and distributed and networked systems. He has also been an editor on volumes of readings in performance evaluation and real-time systems, and for special issues on real-time systems of IEEE Computer and the Proceedings of the IEEE.

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