Table of Contents

1: Historical background and general introduction
2: Physical principles of field ion microscopy
3: FIM image interpretation and application
4: Physical principles of atom probe interpretation
5: Statistical analysis of atom probe data
6: Metallurgical applications
7: Atom probe studies of non-metallic materials, thin films and surface phenomena
Epilogue: future directions

About the Author

Hetherington - deceased

Reviews

`The book is an excellent resource for anyone entering the field ... strongly recommended at all levels among those who feel curious about this non-obvious way of doing high resolution ion microscopy and analysis at the atomic level.'
T. Mulvey, Measurement Science Technology 8 (1997)
`For the practising analyst there are nine useful appendices including one on specimen preparation, and the book will be invaluable to researchers in the above fields.'
Aslib Book Guide, vol.61, no.12, December 1996.