Table of Contents

Preface ; Acknowledgements ; List of Symbols ; 1. Preliminaries ; 2. Electron Optics ; 3. Wave Optics ; 4. Coherence and Fourier Optics ; 5. High-Resolution Images of Crystals and their Defects ; 6. HREM in Biology, Organic Crystals and Radiation Damage ; 7. Image Processing and Superresolution Schemes ; 8. Stem and Z-Contrast ; 9. Electron Sources and Detectors ; 10. Measurement of Electron-optical Parameters Affecting High-Resolution Images ; 11. Instabilities and the Microscope Environment ; 12. Experimental Methods ; 13. Associated Techniques ; Appendix 1 ; Appendix 2 ; Appendix 3 ; Appendix 4 ; Appendix 5

About the Author

John Spence is a Fellow of the American Physical Society and of the Institute of physics, a recent co-editor of Acta Crystallographica and serves on the editorial board of Reports on Progress in Physics. He also serves on the Scientific Advisory Committee of the Molecular Foundary and the Advanced Light Source at the Lawrence Berkeley Laboratory. He is a member of the International Union of Crystallography's Commission on Electron Diffraction, and winner of the Burton award of the Microscopy Society of America.

Reviews

Spence has not neglected the practical side and gives very detailed instructions on how to use the instrument and the environmental and operating conditions required for optimum resolution. Microscopy and Analysis Each section is extensively referenced and there are several useful appendicies...overall this is an excellent book that meets and exceeds the author's aims and contains a wealth of information on high resolution electron microscopy... the book is written in a relaxed style, which makes it suitable for beginning and experienced users alike. Microscopy and Analysis